Mettler-Toledo ProdX 2.0 data management software system

Mettler-Toledo Product Inspection has launched the ProdX 2.0 data management software system. Designed for use on food lines, as well as in pharmaceutical and chemical processing, the software package connects product inspection equipment across the entire production line into a single, unified network. In doing so, it is able to collect in-depth data about productivity and product quality issues, such as foreign body contamination, and access it in real time from one centralised location.

The system not only records the date, time, location of the reject and the reason for removal, it enables manufacturers to store verifying documentation about the active managerial control measures taken to prevent incidents reoccurring in the future. This ensures compliance with a wide range of international food standards as well as pharmaceutical and product quality guidelines.

The product is able to manage data from a wide range of product inspection machines, including X-ray systems, metal detectors, checkweighers and vision inspection equipment. It is even capable of storing X-ray and vision inspection images of rejected packs to allow further analysis of rejection incidents by operatives at a later date.

Featuring a standardised OPC Unified Architecture (OPC UA) server interface, and able to support PackML tags, the software can be seamlessly integrated into existing production line networks. This enables the software to collect data about the performance of all the inspection machines on the production line, from throughput speed to instances of product over- or under-fill, enabling the calculation of the overall equipment effectiveness (OEE) of the manufacturing process by the company’s control and MES system.

The product is available as a turnkey starter pack that can be easily installed on standard-sized production lines and existing network equipment, as well as an expandable base pack that can be scaled to manufacturers’ specific size and connectivity needs.

Originally published here.